THz-scanning microscopy of microwave devices
Description : Ultrafast semiconductor electronic circuits already operate at frequencies well above 100 GHz, already heading towards the THz regime. For such ultrafast electronic circuits, we investigate new measurement methods for characterization. In this research work, we currently concentrate on our scanning microscope for THz radiation distributions. By using new cantilevers with integrated superconducting detectors, it became possible to image the radiation distribution above striplines, filters and other active and passive microwave devices up to frequencies of 760 GHz. The person in the announced PhD position will contribute to the hardware development as well as to the theoretical and numerical description of the expected and measured radiation distributions. Prof. Dr. Schilling You are required to hold an excellent university degree (master’s or equivalent degree) in physics, chemistry, electrical or mechanical engineering, mathematics, information technology or related fields. The entire program is run in English, so fluency in both written and spoken English is required. Skills in German are welcome. You may be a member of and receive a scholarship from the IGSM for up to 3 years. In your first semester, you will be accepted on a probationary basis. Please note that application is only possible online at www.igsm.tu-bs.de.
Homepage : www.igsm.tu-bs.de
Category : Engineering, Metrology
Contact address : www.igsm.tu-bs.de
Keywords :
Name : International Graduate School of Metrology
Email : igsm-application@web.de
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